Study on the aging characteristics and conduction mechanism of metallized film capacitors under electro-thermal coupling effects

Study on the aging characteristics and conduction mechanism of metallized film capacitors under electro-thermal coupling effects

TANG Yu， ZHANG Chuansheng， XIONG Yijia， REN Chengyan， YANG Yong， GAO Shilong， XING Zhaoliang， ZHANG Cheng， SHAO Tao

Advanced Technology of Electrical Engineering and Energy ›› 0

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Advanced Technology of Electrical Engineering and Energy ›› 0 DOI: 10.12067/ATEEE2601051

Study on the aging characteristics and conduction mechanism of metallized film capacitors under electro-thermal coupling effects

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 0 https://doi.org/10.12067/ATEEE2601051

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