Gate-drive open circuit fault diagnosis method for three-level neutral point clamped inverter devices based on DenseNet and ViT

YAN Yan, ZHANG Siyi, LI Chen, WU Jiaqi, SHI Tingna

Advanced Technology of Electrical Engineering and Energy ›› 2025, Vol. 44 ›› Issue (6) : 1-14.

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Advanced Technology of Electrical Engineering and Energy ›› 2025, Vol. 44 ›› Issue (6) : 1-14. DOI: 10.12067/ATEEE2312063
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Gate-drive open circuit fault diagnosis method for three-level neutral point clamped inverter devices based on DenseNet and ViT

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 44(6): 1-14 https://doi.org/10.12067/ATEEE2312063

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