A high bandwidth current measurement method for GaN devices based on symmetrical PCB structure

MEI Yang, FU Qiang

Advanced Technology of Electrical Engineering and Energy ›› 2021, Vol. 40 ›› Issue (8) : 60-65.

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Advanced Technology of Electrical Engineering and Energy ›› 2021, Vol. 40 ›› Issue (8) : 60-65. DOI: 10.12067/ATEEE2102016
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A high bandwidth current measurement method for GaN devices based on symmetrical PCB structure

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 40(8): 60-65 https://doi.org/10.12067/ATEEE2102016

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