Test and analysis of critical current anisotropy of second generation superconducting tape under 0~3.5 T DC background magnetic field

ZHANG Yan, ZHU Jia-hui, CHEN Pan-pan, WANG Hai-yang, QIN Han-yang, DAI Yin-ming, WANG Hui, LIU Hui, FANG Jin

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Advanced Technology of Electrical Engineering and Energy ›› 2020, Vol. 39 ›› Issue (7) : 24-29. DOI: 10.12067/ATEEE1908023

Test and analysis of critical current anisotropy of second generation superconducting tape under 0~3.5 T DC background magnetic field

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 39(7): 24-29 https://doi.org/10.12067/ATEEE1908023

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