Economic losses pre-evaluation of semiconductor enterprise due to voltage sags based on process immunity time

ZHANG Xu-bin, ZHANG Yi, ZHANG Kong-lin, LI Wei-ming, GUO Qing-bo, LI Jian-hua

Advanced Technology of Electrical Engineering and Energy ›› 2018, Vol. 37 ›› Issue (6) : 43-49.

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Advanced Technology of Electrical Engineering and Energy ›› 2018, Vol. 37 ›› Issue (6) : 43-49. DOI: 10.12067/ATEEE1712012
Special Issues for Power Quality in Smart Grid

Economic losses pre-evaluation of semiconductor enterprise due to voltage sags based on process immunity time

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 37(6): 43-49 https://doi.org/10.12067/ATEEE1712012

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